预览加载中，请您耐心等待几秒...

基于IDDQ扫描的SOC可测性设计.docx

预览
1/2
2/2

在线预览结束，喜欢就下载吧，查找使用更方便

下载提示 文本预览

如果您无法下载资料，请参考说明：

1、部分资料下载需要金币，请确保您的账户上有足够的金币

2、已购买过的文档，再次下载不重复扣费

3、资料包下载后请先用软件解压，在使用对应软件打开

基于IDDQ扫描的SOC可测性设计 Introduction: AsthecomplexityanddensityofSystemonChip(SoC)designshaveincreased,sohasthechallengeoftestingthesedesigns.OneofthekeychallengesintestingSoCdesignsisthedifficultyinidentifyinganddiagnosingfaultsinthedesign.Inthiscontext,detectingfaultsinthedesignhasbecomeacriticalaspect,whichaddstothecomplexityoffutureSoCdesigns.IDDQtestingisconsideredanefficienttechniquetodetectinternaldefectsindigitalcircuitsandcanbeappliedtoimprovetheoverallqualityandreliabilityofSoCdesigns. IDDQTesting: IDDQtestingisatechniquethatmeasuresthecurrentconsumptionofacircuitwhenallinputsareheldatastablestate.TheIDDQtestdeterminesthequiescentcurrent(currentinthesteadystate)ofadigitalcircuitandidentifiesfaultsthatarenotdetectedbyothertraditionaltests.Itidentifiesdefectsintheinterconnects,shorts,opencircuits,andstuck-atfaults. ManySoCdesignsincludemultiplecoresthatareintegratedintoasinglechip.Thesecorescommunicatewitheachotherthroughacommoninterconnect.WhentestingacomplexdesignlikeanSoC,testingtheinterconnectcanbemorechallengingthantestingthelogiccoresthemselves.ApplyinganIDDQtesttotheinterconnectcandetectdefectsthatarenotvisiblethroughothertests. IDDQ-basedscandesigntechnique: TheIDDQ-basedscandesigntechniqueaddressestestabilityanddiagnosisissuesforlarge-scaleSoCdesigns.TheIDDQscandesigntechniquetransformsthecircuitintoaformthatisamenabletotestanddiagnosticprograms.Thisapproachinvolvesinsertingscanchainsintothedesignthatprovideaccesstotheinternalcomponentsofthecircuit. Thescanchainscapturethevaluesoftheinternalstatesofthecircuitduringtesting,whichallowthegenerationofIDDQsignatures.TheIDDQsignaturescanthenbecomparedtoreferencesignaturestoidentifyanyfaultsinthecircuit.AsignatureanalyzerisusedtocomparetheseIDDQsignatures.Thiscomparisonproblemcanalsobecapturedmathematicallyandcanbesolvedusingvariousdataminingtechniques. AdvantagesoftheIDDQ-basedscandesigntechnique: ThereareseveraladvantagesofusingtheIDDQ-basedscandesigntechniqueinSoCtesting.Theseinclude: 1.Increasedfaultcoverage