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COB封装的LED的热应力与应变的模拟仿真与分析 Title:SimulationandAnalysisofThermalStressandStrainforCOBPackagedLED Abstract: ThispaperpresentsacomprehensivesimulationandanalysisofthermalstressandstrainforChip-on-Board(COB)packagedLightEmittingDiodes(LEDs).TheobjectiveistostudytheeffectsofthermalstressandstrainontheperformanceandreliabilityofCOBpackagedLEDs.AnumericalmodelisdevelopedtosimulatethethermalbehavioroftheLEDpackageunderdifferentoperatingconditions.Thesimulationresultsarethenanalyzedtoassesstheimpactofthermalstressandstrainonthedevice. 1.Introduction: Thegrowingdemandforhigh-performance,energy-efficientlightingsolutionshasledtothewidespreaduseofCOBpackagedLEDs.TheCOBpackageoffersseveraladvantagesovertraditionalLEDpackages,includingimprovedthermalmanagementandhigherluminousefficacy.However,thethermalstressandstraininducedbytemperaturevariationsintheCOBpackagecanaffectthedevice'sperformanceandreliability.Therefore,understandingandanalyzingthethermalbehaviorofCOBpackagedLEDsiscrucialfortheirdesignandoptimization. 2.Methodology: TosimulatethethermalstressandstrainintheCOBpackagedLED,anumericalsimulationmodelisdevelopedusingfiniteelementanalysis(FEA)techniques.Themodelconsiderstheheattransfermechanisms,includingconvectionandradiation,aswellasthematerialpropertiesandgeometricalcharacteristicsoftheLEDpackage.Thesimulationisperformedundervariousoperatingconditions,suchasdifferentappliedcurrentsandambienttemperatures,tocapturethedynamicthermalbehaviorofthedevice. 3.ResultsandDiscussion: ThesimulationresultsprovidevaluableinsightsintothethermalstressandstraindistributionwithintheCOBpackagedLED.Theanalysisrevealsthathigherappliedcurrentsandambienttemperaturesleadtoincreasedthermalstressandstrainlevels.Thelocationsofmaximumstressandstrainareidentified,helpingintheidentificationofpotentialfailurepointsintheLEDpackage.Furthermore,thetemporalvariationofstressandstrainduringthedeviceoperationisanalyzed,highlightingtheimportanceofthermalmanagementinmaintainingthedevice'slongevityandperformance.