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基于工艺参数扰动的随机互连线时延分析(英文).docx

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基于工艺参数扰动的随机互连线时延分析(英文) Title:AnalysisofRandomInterconnectDelayBasedonProcessParameterDisturbance Abstract: Withthecontinuousdevelopmentofsemiconductortechnology,theprocessparametersofelectronicdevicesbecomemoreandmorecomplexandvaried,whichmakesthedesignofintegratedcircuitsfacegreatchallenges.Inparticular,thedelayofinterconnectlinesisakeyfactorthataffectstheperformanceofelectronicdevices.Inthispaper,weproposeanovelmethodforanalyzingtherandominterconnectdelaybasedonprocessparameterdisturbance.Intheproposedmethod,wefirstestablishastatisticalmodeloftheprocessparameterdisturbance,andthenderiveamathematicalmodelfortheinterconnectdelaybasedonthestatisticalmodel.WethenuseMonteCarlosimulationtoverifytheaccuracyoftheproposedmodel.Thesimulationresultsshowthattheproposedmodelcaneffectivelyanalyzetherandominterconnectdelaycausedbyprocessparameterdisturbance. Introduction: Withtherapiddevelopmentofsemiconductortechnology,thecomplexityandvarietyofprocessparametersinelectronicdeviceshavebeengreatlyincreased.Inparticular,interconnectlinesplayacrucialroleinelectronicdevices.Thedelayofinterconnectlinescansignificantlyaffecttheperformanceofelectronicdevices,anditisamajorsourceofuncertaintyandvariabilityinthedesignofintegratedcircuits.Therefore,itisessentialtodevelopeffectivemethodsforanalyzingtherandominterconnectdelaycausedbyprocessparameterdisturbance. Approaches: Inthispaper,weproposeanovelmethodforanalyzingtherandominterconnectdelaybasedonprocessparameterdisturbance.Themethodconsistsofthreesteps:statisticalmodelingofprocessparameterdisturbance,mathematicalmodelingofinterconnectdelay,andMonteCarlosimulation. StatisticalModelingofProcessParameterDisturbance: Inthisstep,weestablishastatisticalmodeloftheprocessparameterdisturbancebasedonexperimentaldata.Weassumethattheprocessparameterdisturbancefollowsanormaldistribution,andusethemeanandstandarddeviationoftheexperimentaldatatoestimatetheparametersofthedistribution. MathematicalModelingofInterconnectDelay: Inthisstep,wederiveamathematic