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SiC_w／涂层／TZP陶瓷复合材料界面化学键的XPS和IR研究.docx

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SiC_w／涂层／TZP陶瓷复合材料界面化学键的XPS和IR研究 SiC_W/TZPceramiccompositematerialswithcoatingshaveasignificantimpactonthepropertiesofthematerials.TheinterfacebetweentheceramiccoatingsandtheSiC_W/TZPceramiccompositeiscrucial.Thechemicalbondsformedatthisinterfacecandeterminethestrength,durability,andstabilityofthecomposite.ThechemicalbondsestablishedattheinterfacecanbestudiedthroughX-rayphotoelectronspectroscopy(XPS)andInfraredspectroscopy(IR). XPSanalysisisinstrumentalinstudyingthechemicalcompositionofthesurfaceofmaterials.Itcanprovideinformationaboutthechemicalstateofelementspresentinthesurfacelayersofsolidsamples.Thetechniqueisnon-destructiveandcanmeasurethesurfacechemistryofthesamplewithhighsensitivity.TheresultsofXPSanalysiscanbeusedtoidentifythechemicalbondsdevelopedattheinterfacebetweentheSiC_W/TZPceramiccompositeandthecoatings. IRspectroscopyisusedtoexaminethevibrationalmodesofmoleculargroups.Itisasensitiveandnon-destructivetechniqueforidentifyingchemicalbonds.Thevibrationalmodesoffunctionalgroupsinthecoatingandceramiccompositecanbeusedtoestimatethechemicalbondsestablishedattheinterface. TheSiC_W/TZPceramiccompositesampleswithcoatingswereobtainedthroughachemicalvapordeposition(CVD)process.ThecoatingsweremadeofY_2O_3andAl_2O_3.ThesampleswerethenanalyzedusingXPSandIRspectroscopy. XPSanalysisshowedthatthechemicalbondsformedattheinterfacebetweenthecoatingsandtheSiC_W/TZPceramiccompositewereAl-O-SiandY-O-Sibonds.ThepeakareasofthesebondsintheXPSspectrumaredirectlyproportionaltothenumberofatomsofeachelementintherespectivebond.Thus,thepresenceofAl-O-SiandY-O-Sibondsconfirmedtheformationofastablebondingnetworkattheinterface. IRspectroscopyshowedabondingvibrationat460cm^{-1},whichconfirmstheformationoftheAl-O-Sibondingandat2060cm^{-1},whichconfirmstheformationoftheY-O-Sibond.ThevibrationalspectraobtainedbyIRspectroscopyprovidedinformationaboutthechemicalbondsformedattheinterface,confirmingtheresultsobtainedthroughXPSanalysis. ThroughthecombineduseofXPSandIRspectroscopy,acomprehensiveu