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短贯通导体对金属腔体屏蔽效能影响研究（英文）.docx

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短贯通导体对金属腔体屏蔽效能影响研究（英文） ResearchontheImpactofShortConductoronShieldingEffectivenessofMetalCavity Abstract Inthispaper,wehavestudiedtheimpactofshortconductorsontheshieldingeffectivenessofametalliccavity.Theanalysiswascarriedoutusingsimulationmethodsbasedonelectromagneticfieldtheories.Thesimulationresultsshowedthatshortconductorscaninfluencetheshieldingeffectivenessofthemetalcavitybyintroducingadditionalleakagepaths.Moreover,theeffectivenessofshieldingisalsofoundtovarywiththelengthsoftheconductors,theirshapes,andpositionswithinthecavity.Thisstudyissignificantforthedesignandoptimizationofshieldingstructuresinelectronicdevicesandsystems. Keywords:Shortconductor,metalcavity,shieldingeffectiveness,leakagepath,simulation Introduction Inmodernelectronicdevicesandsystems,electromagneticinterference(EMI)hasbecomeacriticalissuethatrequireseffectivemeasuresformitigationandprevention.EMIcancausesystemmalfunction,datacorruptionorloss,andevenposeriskstohumansafety.Therefore,theuseofshieldingstructuresiscommontoattenuatetheradiatedandconductedEMIsignals.AshieldingstructuretypicallyconsistsofametalliccavitythatenclosesthedeviceorsubsystemandreducestheEMIleakagestotheenvironment.However,theshieldingeffectivenessofthemetalliccavityisaffectedbyvariousfactors,includingthepresenceofshortconductorsorcomponentswithinthecavity.Theshortconductorscanintroduceadditionalleakagepathsthatbypasstheshieldingstructureandreduceitseffectiveness. Inthispaper,weaimtoinvestigatetheimpactofshortconductorsontheshieldingeffectivenessofametalliccavityandtoexplorethemeansbywhichtheshieldingperformancecanbeenhanced. Methodology Weusesimulationmethodsbasedonelectromagneticfieldtheoriestoanalyzetheimpactofshortconductorsontheshieldingeffectivenessofthemetalliccavity.Themetalliccavityisconsideredtobeanidealrectangularboxwithspecifieddimensions,madeofaperfectelectricconductor(PEC).ThecavityisexcitedbyaplanewavethatrepresentstheEMIsignal.Thesimulationisperformedusingacommercialelectromagneticsimulationsoftware(CSTMi