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一种新的ESD防护器件的多脉冲TLP仿真方法 Introduction Withtherapiddevelopmentofelectronictechnology,thedemandforelectronicproductshasbeengrowingatasteadypace.Intheprocessofelectronicproduction,oneofthebiggestchallengesthatengineersfaceiselectrostaticdischarge(ESD)protection.ESDisaneventthatoccurswhenachargeisexchangedbetweentwoobjectswithdifferentelectricalpotentials.Intheelectronicfield,ESDcancausedamagetoelectroniccomponents,resultinginreducedperformance,orevenacompletebreakdownoftheelectronicdevice.Therefore,effectiveESDprotectionisvitalinelectronicproductdesign. ToprotectelectroniccomponentsagainstESD,varioustypesofESDprotectiondeviceshavebeendeveloped,includingdiodes,varistors,andtransientvoltagesuppressors.ThesedeviceshelptodissipatetheESDcurrentandprotecttheelectronicdevicefromdamage.However,withtheincreasingintegrationofelectronicdevices,thesizeofelectroniccomponentsisbecomingsmaller,whichmakesitdifficulttointegratetraditionalESDprotectiondevices. Recently,anewtypeofESDprotectiondevicehasbeendeveloped,whichiscalledthemulti-pulsetransientvoltagesuppressor(MPTVS).Thisdevicehastheadvantageofasmallerfootprint,lowercapacitance,andtheabilitytoprovideprotectionagainstmultipleESDevents.Inthispaper,wewilldiscussanewsimulationmethodforMPTVSdevicesusingtransientlinepulsing(TLP). Background TLPtestingisawell-establishedmethodforcharacterizingESDprotectiondevices.ThemethodinvolvesapplyingafastvoltagepulsetogroundtosimulateanESDevent.Thedeviceundertest(DUT)isinsertedbetweenthepulsegeneratorandthegroundtomeasureitsresponsetothepulse.TheTLPwaveformprovidesinformationabouttheESDprotectiondevice'sresponsetime,protectionlevel,andstability. ThetraditionalTLPmethodislimitedtosinglepulsetesting,whichisnotanaccuraterepresentationofreal-worldESDevents.Incontrast,MPTVSdevicesprovideprotectionagainstmultipleESDevents,andanewtestingmethodisneededtoaccuratelymodelthedevice'sresponsetomultiplepulses. Multi-PulseTLPSimulationMethod ToaccuratelysimulatetheMPTVSdevice'sresponsetomultipleESDevents,amulti-pul