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平面SiPCBM与纳米SiPCBM有机-无机杂化异质结的对比研究（英文）.docx

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平面SiPCBM与纳米SiPCBM有机-无机杂化异质结的对比研究（英文） Title:ComparativeStudyoftheSiPCBM-SiPCBMNanohybridHeterojunctionComparingPlanarandNanoscaleInterfaces Abstract: Organic-inorganichybridmaterialshaveattractedsignificantattentionduetotheiruniquepropertiesandpotentialapplicationsinvariousfields.Inparticular,theSiPCBM-SiPCBMnanohybridheterojunctionhasshowngreatpromiseforoptoelectronicdevices.Inthisstudy,weinvestigateandcomparethestructuralandoptoelectronicpropertiesofplanarSiPCBMandnanoscaleSiPCBMheterojunctionstogaininsightsintotheirperformancedifferences. 1.Introduction: 1.1Background: Organic-inorganichybridmaterialshavebeenextensivelystudiedfortheiruseinoptoelectronicdevicessuchassolarcellsandphotodetectors.Thecombinationoforganicsemiconductors,suchasSiPCBM,withinorganicmaterialsoffersenhancedperformanceduetothesynergisticeffectsofthetwocomponents. 1.2Objectives: TheaimofthisstudyistocomparethepropertiesofplanarSiPCBMandnanoscaleSiPCBMheterojunctions,focusingontheirstructural,electrical,andopticalcharacteristics.Understandingthedifferencesbetweenthesetwointerfacesisvitalforimprovingtheirperformanceandoptimizingdevicedesign. 2.Methodology: 2.1MaterialsandFabrication: SiPCBMorganicsemiconductorthinfilmswerepreparedbyspin-coatingonvarioussubstrates.ThenanoscaleSiPCBMheterojunctionwasfabricatedusingalayer-by-layerdepositiontechnique. 2.2CharacterizationTechniques: Structuralcharacterizationwasperformedusingscanningelectronmicroscopy(SEM),atomicforcemicroscopy(AFM),andX-raydiffraction(XRD).Electricalpropertiesweremeasuredusingcurrent-voltage(I-V)characterization,andopticalpropertieswereinvestigatedbyphotoluminescence(PL)andabsorbancespectroscopy. 3.ResultsandDiscussion: 3.1StructuralProperties: TheSEMandAFManalysisrevealedthatthenanoscaleSiPCBMheterojunctionexhibitedamorecompactanduniformmorphologycomparedtotheplanarSiPCBMfilm.XRDresultsindicatedenhancedcrystallinityinthenanoscaleheterojunction,suggestingimprovedchargetransportability. 3.2ElectricalPerformance: Thecurrent-voltagechar