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keV电子致Al的K壳层电离截面和Se的L壳层X射线产生截面的测量研究.docx

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keV电子致Al的K壳层电离截面和Se的L壳层X射线产生截面的测量研究 Title:MeasurementResearchonthekeVElectron-InducedK-ShellIonizationCrossSectionofAlandtheL-ShellX-RayProductionCrossSectionofSe Abstract: Inthisstudy,weinvestigatethekeVelectron-inducedK-shellionizationcrosssectionofAluminum(Al)andtheL-shellX-rayproductioncrosssectionofSelenium(Se).TheprimaryobjectiveistomeasureandunderstandtheionizationandX-rayproductionprocessesinthesematerials.Experimentalmethods,suchaselectronspectroscopy,wereemployedtodeterminetheenergy-lossandX-rayyielddata.TheresultsobtainedprovidevaluableinsightsintothebehaviorofelectronsinKandLshellsforAlandSerespectively,andcontributetoourunderstandingoftheiratomicstructureandelectroninteractionproperties. Keywords:keVelectron,ionizationcrosssection,X-rayproduction,Aluminum(Al),Selenium(Se),energy-loss,electronspectroscopy 1.Introduction: TheinteractionofkeVelectronswithmatterhaslongbeenofinterestinseveralscientificfields,includingmaterialsscienceandatomicphysics.Whenhigh-energyelectronscollidewithatoms,theycancauseionization,resultingintheejectionofelectronsfromtheinneratomicshells.Additionally,theinteractionoftheseionizedatomswithsubsequentelectronscanleadtotheemissionofcharacteristicX-rays.Inthisstudy,wefocusonmeasuringtheionizationcrosssectionoftheKshellinAlandtheX-rayproductioncrosssectionoftheLshellinSe. 2.ExperimentalMethodology: Theexperimentwasconductedusingahigh-resolutionelectronspectrometer,whichallowedforprecisemeasurementoftheenergylossandX-rayyield.Athinfilmoftherespectivematerial(AlandSe)waspreparedonasuitablesubstrateandmountedinvacuum.AbeamofkeVelectronswasthendirectedontothesample,resultinginionizationandX-rayproduction.TheenergylossoftheelectronsandtheresultingX-rayspectraweremeasuredusingtheelectronspectrometer. 3.ResultsandDiscussion: ThemeasuredenergylossspectraforAlandSeprovidedvaluableinformationontheionizationprocessesoccurringintherespectiveKandLshells.Byanalyzingtheenergy-lossdata,weobtainedthedifferentialcrosssectionforelectron-inducedK-shelli